Chun-Chuan Chi, Chih-Yen Lo, Te-Wen Ko, Cheng-Wen Wu. Test Integration for SOC Supporting Very Low-Cost Testers. In Proceedings of the Eighteentgh Asian Test Symposium, ATS 2009, 23-26 November 2009, Taichung, Taiwan. pages 287-292, IEEE Computer Society, 2009. [doi]
Abstract is missing.