A new short-channel-effect-degraded subthreshold behavior model for elliptical gate-all-around MOSFET

Te-Kuang Chiang, Ying-Wen Ko, Hong-Wun Gao, Yeong-Her Wang. A new short-channel-effect-degraded subthreshold behavior model for elliptical gate-all-around MOSFET. In Yajie Qin, Zhiliang Hong, Ting-Ao Tang, editors, 12th IEEE International Conference on ASIC, ASICON 2017, Guiyang, China, October 25-28, 2017. pages 520-524, IEEE, 2017. [doi]

Abstract

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