External Links

Cite Key

Statistics

  • References: 0
  • Cited by: 0
  • Reviews: 0
  • Bibliographies: 0

PDF

Researchr

Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.

Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.

A new short-channel-effect-degraded subthreshold behavior model for elliptical gate-all-around MOSFET

Te-Kuang Chiang, Ying-Wen Ko, Hong-Wun Gao, Yeong-Her Wang. A new short-channel-effect-degraded subthreshold behavior model for elliptical gate-all-around MOSFET. In Yajie Qin, Zhiliang Hong, Ting-Ao Tang, editors, 12th IEEE International Conference on ASIC, ASICON 2017, Guiyang, China, October 25-28, 2017. pages 520-524, IEEE, 2017. [doi]

Authors

Te-Kuang Chiang

This author has not been identified. Look up 'Te-Kuang Chiang' in Google

Ying-Wen Ko

This author has not been identified. Look up 'Ying-Wen Ko' in Google

Hong-Wun Gao

This author has not been identified. Look up 'Hong-Wun Gao' in Google

Yeong-Her Wang

This author has not been identified. Look up 'Yeong-Her Wang' in Google
runs on