Layered Approach to Designing System Test Interfaces

Man Wah Chiang, Zeljko Zilic. Layered Approach to Designing System Test Interfaces. In 21st IEEE VLSI Test Symposium (VTS 2003), 27 April - 1 May 2003, Napa Valley, CA, USA. pages 331-338, IEEE Computer Society, 2003. [doi]

Abstract

Abstract is missing.