Evaluating application-aware soft error effects in digital circuits without fault injections or probabilistic computations

K. Chibani, Michele Portolan, RĂ©gis Leveugle. Evaluating application-aware soft error effects in digital circuits without fault injections or probabilistic computations. In 22nd IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2016, Sant Feliu de Guixols, Spain, July 4-6, 2016. pages 54-59, IEEE, 2016. [doi]

Abstract

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