Field plate related reliability improvements in GaN-on-Si HEMTs

Alessandro Chini, F. Soci, Fausto Fantini, A. Nanni, A. Pantellini, Claudio Lanzieri, D. Bisi, Gaudenzio Meneghesso, Enrico Zanoni. Field plate related reliability improvements in GaN-on-Si HEMTs. Microelectronics Reliability, 52(9-10):2153-2158, 2012. [doi]

@article{ChiniSFNPLBMZ12,
  title = {Field plate related reliability improvements in GaN-on-Si HEMTs},
  author = {Alessandro Chini and F. Soci and Fausto Fantini and A. Nanni and A. Pantellini and Claudio Lanzieri and D. Bisi and Gaudenzio Meneghesso and Enrico Zanoni},
  year = {2012},
  doi = {10.1016/j.microrel.2012.06.040},
  url = {http://dx.doi.org/10.1016/j.microrel.2012.06.040},
  researchr = {https://researchr.org/publication/ChiniSFNPLBMZ12},
  cites = {0},
  citedby = {0},
  journal = {Microelectronics Reliability},
  volume = {52},
  number = {9-10},
  pages = {2153-2158},
}