Alessandro Chini, F. Soci, Fausto Fantini, A. Nanni, A. Pantellini, Claudio Lanzieri, D. Bisi, Gaudenzio Meneghesso, Enrico Zanoni. Field plate related reliability improvements in GaN-on-Si HEMTs. Microelectronics Reliability, 52(9-10):2153-2158, 2012. [doi]
No references recorded for this publication.
No citations of this publication recorded.