The following publications are possibly variants of this publication:
- Impact of field-plate geometry on the reliability of GaN-on-SiC HEMTsAlessandro Chini, F. Soci, Fausto Fantini, A. Nanni, A. Pantellini, Claudio Lanzieri, Gaudenzio Meneghesso, Enrico Zanoni. mr, 53(9-11):1461-1465, 2013. [doi]
- Electrical characterization and reliability study of HEMTs on composite substrates under high electric fieldsAugusto Tazzoli, Gaudenzio Meneghesso, Franco Zanon, Francesca Danesin, Enrico Zanoni, P. Bove, R. Langer, J. Thorpe. mr, 48(8-9):1370-1374, 2008. [doi]