Francesca Chiocchetta, Carlo De Santi, Fabiana Rampazzo, Kalparupa Mukherjee, Jan Grünenpütt, Daniel Sommer, Hervé Blanck, Benoit Lambert, A. Gerosa, Gaudenzio Meneghesso, Enrico Zanoni, Matteo Meneghini. GaN RF HEMT Reliability: Impact of Device Processing on I-V Curve Stability and Current Collapse. In IEEE International Reliability Physics Symposium, IRPS 2022, Dallas, TX, USA, March 27-31, 2022. pages 11, IEEE, 2022. [doi]
@inproceedings{ChiocchettaSRMG22,
title = {GaN RF HEMT Reliability: Impact of Device Processing on I-V Curve Stability and Current Collapse},
author = {Francesca Chiocchetta and Carlo De Santi and Fabiana Rampazzo and Kalparupa Mukherjee and Jan Grünenpütt and Daniel Sommer and Hervé Blanck and Benoit Lambert and A. Gerosa and Gaudenzio Meneghesso and Enrico Zanoni and Matteo Meneghini},
year = {2022},
doi = {10.1109/IRPS48227.2022.9764510},
url = {https://doi.org/10.1109/IRPS48227.2022.9764510},
researchr = {https://researchr.org/publication/ChiocchettaSRMG22},
cites = {0},
citedby = {0},
pages = {11},
booktitle = {IEEE International Reliability Physics Symposium, IRPS 2022, Dallas, TX, USA, March 27-31, 2022},
publisher = {IEEE},
isbn = {978-1-6654-7950-9},
}