Study of short-circuiting between adjacent joints under electric field effects in fine pitch anisotropic conductive adhesive interconnects - researchr publication

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Y. W. Chiu, Y. C. Chan, S. M. Lui. Study of short-circuiting between adjacent joints under electric field effects in fine pitch anisotropic conductive adhesive interconnects. Microelectronics Reliability, 42(12):1945-1951, 2002. [doi]

Abstract is missing.

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