Experimental assessment of logic circuit performance variability with regular fabrics at 90nm technology node

Sungdae Choi, Katsuyuki Ikeuchi, Hyunkyung Kim, Kenichi Inagaki, Masami Murakata, Nobuyuki Nishiguchi, Makoto Takamiya, Takayasu Sakurai. Experimental assessment of logic circuit performance variability with regular fabrics at 90nm technology node. In William Redman-White, Anthony J. Walton, editors, ESSCIRC 2008 - 34th European Solid-State Circuits Conference, Edinburgh, Scotland, UK, 15-19 September 2008. pages 50-53, IEEE, 2008. [doi]

Abstract

Abstract is missing.