Jiwon Choi, Hayoung Jeoung, Jihun Kim, Youngjoo Ko, Wonup Jung, Hanjun Kim, Jong Kim 0001. Detecting and Identifying Faulty IoT Devices in Smart Home with Context Extraction. In 48th Annual IEEE/IFIP International Conference on Dependable Systems and Networks, DSN 2018, Luxembourg City, Luxembourg, June 25-28, 2018. pages 610-621, IEEE Computer Society, 2018. [doi]
Abstract is missing.