Sungsoon Choi, Wooyoung Lee, Kwanhoon Lee. Delamination lifetime evaluation of IPM by accelerated power cycle test. In International Conference on Electronics, Information and Communications, ICEIC 2014, Kota Kinabalu, Sabah, Malaysia, January 15-18, 2014. pages 1-2, IEEE, 2014. [doi]
Abstract is missing.