Won Ho Choi, Saroj Satapathy, John Keane, Chris H. Kim. A test circuit based on a ring oscillator array for statistical characterization of Plasma-Induced Damage. In Proceedings of the IEEE 2014 Custom Integrated Circuits Conference, CICC 2014, San Jose, CA, USA, September 15-17, 2014. pages 1-4, IEEE, 2014. [doi]
Abstract is missing.