MAEPER: Matching Access and Error Patterns With Error-Free Resource for Low Vcc L1 Cache

Young-Geun Choi, Sungjoo Yoo, Sunggu Lee, Jung Ho Ahn, Kangmin Lee. MAEPER: Matching Access and Error Patterns With Error-Free Resource for Low Vcc L1 Cache. IEEE Trans. VLSI Syst., 21(6):1013-1026, 2013. [doi]

Abstract

Abstract is missing.