Nilotpal Choudhury, Narendra Parihar, Souvik Mahapatra. Analysis of The Hole Trapping Detrapping Component of NBTI Over Extended Temperature Range. In 2020 IEEE International Reliability Physics Symposium, IRPS 2020, Dallas, TX, USA, April 28 - May 30, 2020. pages 1-5, IEEE, 2020. [doi]
Abstract is missing.