Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.
Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.
N. A. Chowdhury, X. Wang, G. Bersuker, C. Young, N. Rahim, D. Misra. Temperature dependent time-to-breakdown (T::BD::) of TiN/HfO::2:: n-channel MOS devices in inversion. Microelectronics Reliability, 49(5):495-498, 2009. [doi]
Abstract is missing.