Kyriakos Christou, Maria K. Michael, Spyros Tragoudas. On the Use of ZBDDs for Implicit and Compact Critical Path Delay Fault Test Generation. J. Electronic Testing, 24(1-3):203-222, 2008. [doi]
@article{ChristouMT08,
title = {On the Use of ZBDDs for Implicit and Compact Critical Path Delay Fault Test Generation},
author = {Kyriakos Christou and Maria K. Michael and Spyros Tragoudas},
year = {2008},
doi = {10.1007/s10836-007-5020-8},
url = {http://dx.doi.org/10.1007/s10836-007-5020-8},
tags = {testing},
researchr = {https://researchr.org/publication/ChristouMT08},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {24},
number = {1-3},
pages = {203-222},
}