Fine resolution double edge clipping with calibration technique for built-in at-speed delay testing

Chen-I Chung, Shuo-Wen Chang, Ching-Hwa Cheng. Fine resolution double edge clipping with calibration technique for built-in at-speed delay testing. In Gordon W. Roberts, Bill Eklow, editors, 2009 IEEE International Test Conference, ITC 2009, Austin, TX, USA, November 1-6, 2009. pages 1, IEEE, 2009. [doi]

Abstract

Abstract is missing.