Chen-I Chung, Jyun-Sian Jhou, Ching-Hwa Cheng. Built-in self at-speed delay binning and calibration mechanism in wireless test platform. In Proceedings of the 15th Asia South Pacific Design Automation Conference, ASP-DAC 2010, Taipei, Taiwan, January 18-21, 2010. pages 357-358, IEEE, 2010. [doi]
Abstract is missing.