Chen-I Chung, Jyun-Sian Jhou, Ching-Hwa Cheng, Sih-Yan Li. Functional Built-In Delay Binning and Calibration Mechanism for On-Chip at-Speed Self Test. In Proceedings of the Eighteentgh Asian Test Symposium, ATS 2009, 23-26 November 2009, Taichung, Taiwan. pages 163-168, IEEE Computer Society, 2009. [doi]
Abstract is missing.