Jaeyong Chung, Joonsung Park, Jacob A. Abraham, Eonjo Byun, Cheol-Jong Woo. Reducing test time and area overhead of an embedded memory array built-in repair analyzer with optimal repair rate. In 28th IEEE VLSI Test Symposium, VTS 2010, April 19-22, 2010, Santa Cruz, California, USA. pages 33-38, IEEE Computer Society, 2010. [doi]
Abstract is missing.