Mauro Ciappa, Ying Pang, Chenchen Sun. Experimental characterization of critical high-electric field spots in power semiconductors by planar and scanning collimated alpha sources. Microelectronics Reliability, 88:476-481, 2018. [doi]
@article{CiappaPS18,
title = {Experimental characterization of critical high-electric field spots in power semiconductors by planar and scanning collimated alpha sources},
author = {Mauro Ciappa and Ying Pang and Chenchen Sun},
year = {2018},
doi = {10.1016/j.microrel.2018.07.129},
url = {https://doi.org/10.1016/j.microrel.2018.07.129},
researchr = {https://researchr.org/publication/CiappaPS18},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {88},
pages = {476-481},
}