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A Robust 130 nm-CMOS Built-In Current Sensor Dedicated to RF Applications

M. Cimino, Hervé Lapuyade, M. De Matos, Thierry Taris, Yann Deval, Jean-Baptiste Begueret. A Robust 130 nm-CMOS Built-In Current Sensor Dedicated to RF Applications. J. Electronic Testing, 23(6):593-603, 2007. [doi]

Authors

M. Cimino

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Hervé Lapuyade

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M. De Matos

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Thierry Taris

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Yann Deval

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Jean-Baptiste Begueret

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