Hot topic session 12B: Stay relevant with standards-based DFT

C. J. Clark, VĂ­ctor H. Champac. Hot topic session 12B: Stay relevant with standards-based DFT. In IEEE 32nd VLSI Test Symposium, VTS 2014, Napa, CA, USA, April 13-17, 2014. pages 1, IEEE, 2014. [doi]

Abstract

Abstract is missing.