Joseph Cohen, Jun Ni. A Deep Fuzzy Semi-supervised Approach to Clustering and Fault Diagnosis of Partially Labeled Semiconductor Manufacturing Data. In Julia Rayz, Victor Raskin, Scott Dick, Vladik Kreinovich, editors, Explainable AI and Other Applications of Fuzzy Techniques - Proceedings of the 2021 Annual Conference of the North American Fuzzy Information Processing Society, NAFIPS 2021, Virtual Event / West Lafayette, IN, USA, June 7-9, 2021. Volume 258 of Lecture Notes in Networks and Systems, pages 62-73, Springer, 2021. [doi]
Abstract is missing.