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Analysis of Modularity by an Aspect-Oriented Measurement Process

José María Conejero, Juan Hernández, Elena Jurado, Klaas van den Berg. Analysis of Modularity by an Aspect-Oriented Measurement Process. In Ana Moreira, María José Suárez Cabal, Claudio de la Riva, Javier Tuya, editors, XIII Jornadas de Ingeniería del Software y Bases de Datos (JISBD 2008), Gijón, Spain, October 7-10, 2008. Proceedings. pages 3-14, 2008.

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