Kypros Constantinides, Todd M. Austin. Using introspective software-based testing for post-silicon debug and repair. In Sachin S. Sapatnekar, editor, Proceedings of the 47th Design Automation Conference, DAC 2010, Anaheim, California, USA, July 13-18, 2010. pages 537-542, ACM, 2010. [doi]
Abstract is missing.