Trends and Trade-offs in Designing Highly Robust Throughput on Chip Communication Network

Marcello Coppola. Trends and Trade-offs in Designing Highly Robust Throughput on Chip Communication Network. In 12th IEEE International On-Line Testing Symposium (IOLTS 2006), 10-12 July 2006, Como, Italy. pages 80, IEEE Computer Society, 2006. [doi]

Abstract

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