An assessment methodology for trace reduction techniques - researchr publication authors

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Bas Cornelissen, Leon Moonen, Andy Zaidman. An assessment methodology for trace reduction techniques. In 24th IEEE International Conference on Software Maintenance (ICSM 2008), September 28 - October 4, 2008, Beijing, China. pages 107-116, IEEE, 2008. [doi]

Identified as Bas Cornelissen Identified as Leon Moonen Identified as Andy Zaidman

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