Assessing the Quality Level of Digital CMOS IC's under the Hypothesis of Non-Uniform Distribution of Fault Probabilities

Francesco Corsi, Cristoforo Marzocca, S. Martino. Assessing the Quality Level of Digital CMOS IC's under the Hypothesis of Non-Uniform Distribution of Fault Probabilities. In 1996 European Design and Test Conference, ED&TC 1996, Paris, France, March 11-14, 1996. pages 72-78, IEEE Computer Society, 1996. [doi]

Abstract

Abstract is missing.