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I. Cortés, G. Toulon, F. Morancho, E. Hugonnard-Bruyere, B. Villard, W. J. Toren. Analysis and optimization of lateral thin-film Silicon-on-insulator (SOI) MOSFET transistors. Microelectronics Reliability, 52(3):503-508, 2012. [doi]
Abstract is missing.