Brian Crafton, Zishen Wan, Samuel Spetalnick, Jong-Hyeok Yoon, Wei Wu, Carlos Tokunaga, Vivek De, Arijit Raychowdhury. Improving compute in-memory ECC reliability with successive correction. In Rob Oshana, editor, DAC '22: 59th ACM/IEEE Design Automation Conference, San Francisco, California, USA, July 10 - 14, 2022. pages 745-750, ACM, 2022. [doi]
Abstract is missing.