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Bacterial Load of Virtual Reality Headsets

Benjamin Creel, Caitlin J. Rinz-Jones, Adam Jones, Colin Jackson. Bacterial Load of Virtual Reality Headsets. In Robert J. Teather, Chris Joslin, Wolfgang Stuerzlinger, Pablo Figueroa, Yaoping Hu, Anil Ufuk Batmaz, Wonsook Lee, Francisco R. Ortega, editors, VRST '20: 26th ACM Symposium on Virtual Reality Software and Technology, Virtual Event, Canada, November 1-4, 2020. ACM, 2020. [doi]

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