Michael Crocker, Michael T. Niemier, Xiaobo Sharon Hu. Fault Models and Yield Analysis for QCA-based PLAs. In Koen Bertels, Walid A. Najjar, Arjan J. van Genderen, Stamatis Vassiliadis, editors, FPL 2007, International Conference on Field Programmable Logic and Applications, Amsterdam, The Netherlands, 27-29 August 2007. pages 435-440, IEEE, 2007. [doi]
Abstract is missing.