Kristof Croes, Veerle Simons, Brecht Truijen, Philippe Roussel, Koen Van Sever, Artemisia Tsiara, Jacopo Franco, Philippe Absil. Degradation mechanisms and lifetime assessment of Ge Vertical PIN photodetectors. In Optical Fiber Communications Conference and Exhibition, OFC 2022, San Diego, CA, USA, March 6-10, 2022. pages 1-3, IEEE, 2022. [doi]
Abstract is missing.