Alfred L. Crouch. Future Trends in Test: The Adoption and Use of Low Cost Structural Testers. In Proceedings 2004 International Test Conference (ITC 2004), October 26-28, 2004, Charlotte, NC, USA. pages 698-703, IEEE, 2004. [doi]
@inproceedings{Crouch04,
title = {Future Trends in Test: The Adoption and Use of Low Cost Structural Testers},
author = {Alfred L. Crouch},
year = {2004},
doi = {10.1109/ITC.2004.82},
url = {http://doi.ieeecomputersociety.org/10.1109/ITC.2004.82},
tags = {testing},
researchr = {https://researchr.org/publication/Crouch04},
cites = {0},
citedby = {0},
pages = {698-703},
booktitle = {Proceedings 2004 International Test Conference (ITC 2004), October 26-28, 2004, Charlotte, NC, USA},
publisher = {IEEE},
isbn = {0-7803-8581-0},
}