A New PUF Based Lock and Key Solution for Secure In-Field Testing of Cryptographic Chips

Aijiao Cui, Chip-Hong Chang, Wei Zhou, Yue Zheng. A New PUF Based Lock and Key Solution for Secure In-Field Testing of Cryptographic Chips. IEEE Trans. Emerging Topics Comput., 9(2):1095-1105, 2021. [doi]

Abstract

Abstract is missing.