Ãtalo Cunha, Renata Teixeira, Nick Feamster, Christophe Diot. Measurement methods for fast and accurate blackhole identification with binary tomography. In Anja Feldmann, Laurent Mathy, editors, Proceedings of the 9th ACM SIGCOMM Conference on Internet Measurement 2009, Chicago, Illinois, USA, November 4-6, 2009. pages 254-266, ACM, 2009. [doi]
Abstract is missing.