Alexander Czutro, Matthias Sauer, Tobias Schubert, Ilia Polian, Bernd Becker. SAT-ATPG using preferences for improved detection of complex defect mechanisms. In 30th IEEE VLSI Test Symposium, VTS 2012, Maui, Hawaii, USA, 23-26 April 2012. pages 170-175, IEEE, 2012. [doi]
Abstract is missing.