E. D'Arcangelo, Andrea Irace, Giovanni Breglio, Paolo Spirito. Experimental characterization of temperature distribution on Power MOS devices during Unclamped Inductive Switching. Microelectronics Reliability, 44(9-11):1455-1459, 2004. [doi]
@article{DArcangeloIBS04,
title = {Experimental characterization of temperature distribution on Power MOS devices during Unclamped Inductive Switching},
author = {E. D'Arcangelo and Andrea Irace and Giovanni Breglio and Paolo Spirito},
year = {2004},
doi = {10.1016/j.microrel.2004.07.039},
url = {http://dx.doi.org/10.1016/j.microrel.2004.07.039},
researchr = {https://researchr.org/publication/DArcangeloIBS04},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {44},
number = {9-11},
pages = {1455-1459},
}