A Single Event Upset Resilient Latch Design with Single Node Upset Immunity

Xixi Dai, Haibin Wang, Jiamin Chu, Zhi Liu, Li Cai, Kang Yan. A Single Event Upset Resilient Latch Design with Single Node Upset Immunity. J. Electronic Testing, 35(6):909-916, 2019. [doi]

Abstract

Abstract is missing.