On Covering Structural Defects in NoCs by Functional Tests

Atefe Dalirsani, Nadereh Hatami, Michael E. Imhof, Marcus Eggenberger, Gert Schley, Martin Radetzki, Hans-Joachim Wunderlich. On Covering Structural Defects in NoCs by Functional Tests. In 23rd IEEE Asian Test Symposium, ATS 2014, Hangzhou, China, November 16-19, 2014. pages 87-92, IEEE Computer Society, 2014. [doi]

Abstract

Abstract is missing.