Efficiently Generating Test Data to Kill Stubborn Mutants by Dynamically Reducing the Search Domain

Xiangying Dang, Xiangjuan Yao, Dunwei Gong, Tian Tian. Efficiently Generating Test Data to Kill Stubborn Mutants by Dynamically Reducing the Search Domain. IEEE Transactions on Reliability, 69(1):334-348, 2020. [doi]

Abstract

Abstract is missing.