NBT stress-induced degradation and lifetime estimation in p-channel power VDMOSFETs

D. Dankovic, I. Manic, S. Djoric-Veljkovic, V. Davidovic, S. Golubovic, Ninoslav Stojadinovic. NBT stress-induced degradation and lifetime estimation in p-channel power VDMOSFETs. Microelectronics Reliability, 46(9-11):1828-1833, 2006. [doi]

Abstract

Abstract is missing.