Low-cost backside laser test method to pre-characterize the COTS IC s sensitivity to Single Event Effects

F. Darracq, Hervé Lapuyade, N. Buard, Pascal Fouillat, R. Dufayel, T. Carriere. Low-cost backside laser test method to pre-characterize the COTS IC s sensitivity to Single Event Effects. Microelectronics Reliability, 43(9-11):1615-1619, 2003. [doi]

Abstract

Abstract is missing.