Tejasvi Das, P. R. Mukund. Sensitivity analysis for fault-analysis and tolerance in RF front-end circuitry. In Rudy Lauwereins, Jan Madsen, editors, 2007 Design, Automation and Test in Europe Conference and Exposition (DATE 2007), April 16-20, 2007, Nice, France. pages 1277-1282, ACM, 2007. [doi]
Abstract is missing.