Sajal K. Das, Hemanshu Roy Pota, Ian R. Petersen. High bandwidth multi-variable combined resonant and integral resonant controller for fast image scanning of atomic force microscope. In 2013 IEEE/ASME International Conference on Advanced Intelligent Mechatronics, Wollongong, Australia, July 9-12, 2013. pages 838-843, IEEE, 2013. [doi]
Abstract is missing.