Crosstalk and Gate Oxide Reliability Analysis in Graphene Nanoribbon Interconnects

Debaprasad Das, Hafizur Rahaman. Crosstalk and Gate Oxide Reliability Analysis in Graphene Nanoribbon Interconnects. In International Symposium on Electronic System Design, ISED 2011, Kochi, Kerala, India, December 19-21, 2011. pages 182-187, IEEE, 2011. [doi]

Abstract

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