Basab Datta, Wayne Burleson. A high sensitivity and process tolerant digital thermal sensing scheme for 3-D Ics. In David Atienza, Yuan Xie, José L. Ayala, Ken S. Stevens, editors, Proceedings of the 21st ACM Great Lakes Symposium on VLSI 2010, Lausanne, Switzerland, May 2-6, 2011. pages 289-294, ACM, 2011. [doi]
Abstract is missing.